The SP2-XR calibration analysis toolkit is written in IGOR and allows the user to quickly analyze scattering and incandescence calibration data. The program analyzes particle ADC peaks within the Particle by Particle (PbP) data generated by the SP2-XR instrument. The software fits a Gaussian to the instrument response for each particle size. This response and the particle sizes are then fit to produce a threshold table, which is imported into the Labview interface of the SP2-XR. This allows for real-time conversion of the SP2-XR raw data to black carbon mass and particle size. The Toolkit is not intended to be used for detailed analysis of the SP2-XR data, but serves only as a tool for quickly processing calibration data.